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Material growth facilities
LPCVD hot-wall chamber
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Deposition SiC nanothin film on to Si substrate
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Large sale wafer up to 300-mm in diameter
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Multiple wafer deposition in a single run
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In situ dopant
Silicon oxide growth
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Low temperature oxide deposition chamber (at 400C)
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Wet thermal oxidation chamber (thermo oxide)
Fabrication facilities
Lithography instrumentation
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Doubles-sided aligner
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Mask-less aligner (MLA 150)
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Spincoaters compatible with 6-inch wafer
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Photoresist developing equipment
Wet/dry etching
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ICP etcher (SiC/Si)
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RIE (SiC, Si)
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Fume hood for wet etching (KOH, TMAH, HNA)
Metallization
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Metal sputtering system
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Thermal evaporator
Soft-lithography
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Spin coater for soft materials (Polyimide, PDMS, SU8)
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Laser machining
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3D-printer for molding (PDMS, EcoFlex)
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Vacuum oven
Characterization facilities
Material characterization
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AFM (Park System)
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SEM (JEOL)
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Raman Spectroscopy (Renishaw)
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Optical Microscope
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Florescent microscope
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Others (TEM,XRD) with CMM at UQ
Electrical characterization
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Electron device parameter analyzer (Agilent A1500)
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Keysight Multimeter
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Keysight Oscilloscope
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Function generators
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Network Analyzer
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Wire bonding machine
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High temperature probe station
Mechanical characterization
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Liner-motor stretcher
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Tensile testing machines (Located at GC campus)
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Temperature-controllable Linkam chamber
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Air pressure setup
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Laser Doppler Vibrometer
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Syringe pumps (for microfluidics)
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